Sina Shahbazmohamadi, Ph.D.
Hardware Security Assurance, Non-destructive Reliability and Failure Analysis of micro/nanoscale systems, X-ray Tomography and applications, Tera Hertz Spectroscopy and Imaging, Advanced Manufacturing Techniques.
Bronwell, 260 Glenbrook Road, Unit 3247
University of Connecticut
Storrs, CT 06269-3247
BS (Mechanical Engineering) Semnan University
MS (Mechanical Engineering) University of Connecticut
PhD (Mechanical Engineering) University of Connecticut
Post Doc Fellowship (Electrical and Computer Engineering) University of Connecticut
Google Scholar Citations Link
Asadizanjani, Navid, Sina Shahbazmohamadi, and Eric H. Jordan. “Optimization and development of X-ray Microscopy Technique for investigation of Thermal Barrier Coating” Ceramic Transactions,2015(Accepted for publication)
2. Quadir S.E, Chen J., Forte D., Asadizanjani N., Shahbazmohamadi S., Wang L., Chandy J., Tehranipoor M., “A survey on chip to system reverse engineering” ACM journal on emerging technologies in computing systems (JETC), 2015 (Accepted for publication).
3. Mahmood, Kaleel, Pedro Latorre Carmona, Sina Shahbazmohamadi, Filiberto Pla, and Bahram Javidi. “Real Time Automated Counterfeit Integrated Circuit Detection using X-ray Microscopy.” Applied Optics Vol. 54, Iss. 13, pp. D25–D32 (2015)
4. Howe, Robert, Sina Shahbazmohamadi, Richard Bass, and Prabhakar Singh. “Digital evaluation and replication of period wind instruments: the role of micro-computed tomography and additive manufacturing.” Early Music (2014) 42 (4): 529-536
5. Shahbazmohamadi, Sina, Domenic Forte, and Mark Tehranipoor. “Advanced Physical Inspection Methods for Counterfeit IC Detection.” In ISTFA 2014: Proceedings from the 40th International Symposium for Testing and Failure Analysis, p. 55. 2014